Equipment

Confocal Raman spectrophotometer, also covering photoluminescence. Additional heating/cryogenic capabilities. 532 and 785 nm lasers are available, along with motorized sample positioner.

The Icon is the latest evolution of our industryleading, tip-scanning AFM technology, incorporating temperature-compensating position sensors to render noise levels in the sub-angstrom range for the Z-axis, and angstroms in X-Y.

The TPT HB16 model is a Ball/wedge wire bonder that enables electrical interconnection between a device chip and package using a gold wire.

Microscope for UV-visible-NIR spectra of sub-micron areas, determines thin film thickness/color spaces. Enables simultaneous high-res imaging and Raman (PL) spectra at 532/785 (405) nm.

The OV-CFM system is based on a well-proven modular design incorporating proprietary technology to allow a vector magnet and integrated variable temperature sample space to be operated in a way that allows precise temperature control while varying the magnetic field. The magnet operates dry and no liquid cryogens are required at start up or during operation

X-ray Analytical Microscope

The FIB-SEM dual beam system combines two powerful techniques: focused ion beam (FIB) milling and scanning electron microscopy (SEM) imaging. This system allows for both high-resolution imaging and precise material modification on a nanometer scale.

Fourier-transform spectrometer for analyzing near-IR, mid-IR, and far-IR spectra of bulk samples. Offers ATR, transmission, and reflection configurations and multiple detectors of various sensitivity.

The Unico glovebox is used to handle sensitive or moisture-free materials under a neutral environment.

Magnetic Property Measurement System: An advanced magnetometer with precise magnetic property measurements

The Zetasizer Nano ZS is a high performance two angle particle, zeta-potential, and molecular size analyzer for the enhanced detection of aggregates and small particles. 

The Dektak is a mechanical profiler to measure surface topography and roughness of the substrate with a resolution <1nm in Z.

Multipurpose X-ray diffractometer: Customisable X-ray diffractometer configurations for efficient crystallographic characterisation of the materials across scientific disciplines.

Hysitron TS 77 Select Nanoindenter The Hysitron TS 77 Select automated benchtop nanomechanical and nanotribological test system provides the highest level of performance, functionality, and accessibility of any instrument in its class. Built around Bruker’s renowned TriboScope capacitive transducer technology, this new test system delivers reliable mechanical and tribological characterization over nanometer-to-micrometer length scales. Supporting the most prominent testing modes, the TS Select is an affordable entry into quantitative nanoindentation, dynamic nanoindentation, nanoscratch, nanowear, and high-resolution mechanical property mapping.

Physical Property Measurement System: An advanced cryogenic system that facilitates precise material physical characterisation

The Model 900 is a manual system for grinding or polishing substrate.

The MCR302 Rheometer has multiple analysis modes such as the flow, rotational, and oscillatory test with sweeping amplitude or frequency at different temperatures.

The FEI Quanta is a Schottky field emission gun-scanning electron microscope (FEG-SEM), commonly used for high resolution imaging and surface characterization.