Sasaki Changes the Sample
![Sasaki Changes the Sample](/sites/default/files/styles/embed_portrait_lg_1x/public/photos/IMG_5927.jpg?itok=VPRehSiW)
Toshio Sasaki removes the sample from the FIB/SEM machine and replaces it with a cartridge used to recalibrate the microscope. The cartridge contains different materials, which will each refract an electron in a particular direction and at a particular speed. The FIB/SEM measures these electrons and adjusts its detection system accordingly.
Toshio Sasaki removes the sample from the FIB/SEM machine and replaces it with a cartridge used to recalibrate the microscope. The cartridge contains different materials, which will each refract an electron in a particular direction and at a particular speed. The FIB/SEM measures these electrons and adjusts its detection system accordingly.
Date:
07 August 2014
Copyright OIST (Okinawa Institute of Science and Technology Graduate University, 沖縄科学技術大学院大学). Creative Commons Attribution 4.0 International License (CC BY 4.0).
Tags
Research