Electron trap system
![Images of the electron trap architecture. Top: Schematic representation of the experiment. Current of surface electrons, induced by ac voltage applied to the electrode underneath reservoir 1, flows between reservoirs 1 and 4, as shown by the red arrow. Middle: Cross section of the central microchannel around the electron trap area. Bottom: Photograph of the microchannel device on a copper sample cell, with subsequent close-up photographs of the central channel and surrounding reservoirs.](/sites/default/files/styles/embed_portrait_lg_1x/public/photos/Figure%201%20final%20final.jpg?itok=DZtDYTiM)
Images of the electron trap architecture. Top: Schematic representation of the experiment. Current of surface electrons, induced by ac voltage applied to the electrode underneath Reservoir 1, flows between Reservoirs 1 and 4 through the central microchannel, as shown by the red arrow. Middle: Cross section of the central microchannel around the trap area. Bottom: Photograph of the microchannel device on a copper sample cell, with subsequent close-up photographs of the central channel and surrounding reservoirs.
Images of the electron trap architecture used by the Quantum Dynamics Unit. Top: Schematic representation of the experiment. Current of surface electrons, induced by ac voltage applied to the electrode underneath Reservoir 1, flows between Reservoirs 1 and 4 through the central microchannel, as shown by the red arrow. Middle: Cross section of the central microchannel around the gate area. Bottom: Photograph of the microchannel device on a copper sample cell, with subsequent close-up photographs of the central channel and surrounding reservoirs.
Copyright OIST (Okinawa Institute of Science and Technology Graduate University, 沖縄科学技術大学院大学). Creative Commons Attribution 4.0 International License (CC BY 4.0).
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