Equipment

titan

Manufacturer: FEI Model: Titan ETEM Features: Acc. Voltage: 80 - 300 keV

External Use: Yes | User/Staff Operated

Helios

Focused Ion Beam / Scanning Electron Microscope (FIB-SEM)

Maker: Thermofisher Scientific

Model: Helios NanoLab 650

The Helios is equipped with a dual beam system: a focused gallium ion beam (FIB) for sample processing and an electron beam (SEM) for simultaneous imaging. Our system is mainly used for FIB-SEM tomography of resin embedded biological samples.

External Use: No | User/Staff Operated

TEM

JEOL 1400 Flash Transmission Electron Microscope TEM

Model: JSM-1400

Manufacturer: JEOL Model: JSM-1400 Features: Acc. Voltage: 100 keV

External Use: Yes | User/Staff Operated

ARM

JEOL ARM200F Transmission Electron Microscope TEM

Manufacturer: JEOL Model: JEM-ARM200F Features: Acc. Voltage: 60 - 200 keV

External Use: Yes | User/Staff Operated

SEM

JEOL JSM-7900F Scanning Electron Microscope SEM

Model: JSM-7900F

Manufacturer: JEOL Model: JSM-7900F Features: A device is capable of SEM imaging in high vacuum and low vaccume mode with mutiple detectors from low accelerating voltage (100 V)

External Use: Yes | User/Staff Operated

SEM Sanning Electron Microscope ENG-N7

Scanning Electron Microscope SEM

Model: Quanta 250

The FEI Quanta is a Schottky field emission gun-scanning electron microscope (FEG-SEM), commonly used for high resolution imaging and surface characterization.

External Use: Yes | User/Staff Operated

Teneo VS

Serial Block-Face Scanning Electron Microscope (SBF-SEM)

Maker: Thermofisher Scientific

Model: Teneo-VS

The Teneo has a build-in microtome that allows the removal of a thin layer of resin with subsequent imaging of the remaining block-face to acquire high-resolution data of large volumes.

External Use: No | User/Staff Operated