Focused Ion Beam / Scanning Electron Microscope (FIB-SEM)
The Helios is equipped with a dual beam system: a focused gallium ion beam (FIB) for sample processing and an electron beam (SEM) for simultaneous imaging.
Our system is mainly used for FIB-SEM tomography of resin embedded biological samples.
A cryo-stage from Quorum Company, UK, allows to process and image cryo-samples.
Inventory ID:
IMG-E007
Manufacturer:
Thermofisher Scientific
Model:
Helios NanoLab 650
Year Installed:
2011
Category
Section
Room Number:
B472
Open to External Use?:
No
Operation:
User/Staff Operated
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