Bruker/ JPK Nanowizard4

Manufacture: Bruker/ JPK
Model: Nanowizard4

The device is a tip-scanning atomic force microscope (AFM) and capable to AFM imaging in conventional scanning mode ( DC and AC mode) and specific quantitive imaging mode called QI mode for physical property analysis.  
The AFM is also capable to obtain image in solution with temperature control.  
The device has also function to optical integration called Direct overlay, which is capable to overlay AFM image on optical microscope images.