JEOL ARM200F Transmission Electron Microscope TEM

Manufacturer: JEOL
Model: JEM-ARM200F

Features:

Acc. Voltage: 60 - 200 keV

A device capable of observing atoms with high resolution,  TEMmode and STEM mode (with Cs correction function), an EDXdetector and an EELS detector. (Scanning resolution: 0.078 nm)