JEOL JSM-7900F Scanning Electron Microscope SEM

Manufacturer: JEOL
Model: JSM-7900F

Features:

A device is capable of SEM imaging in high vacuum and low vaccume mode with mutiple detectors  from low accelerating voltage (100 V) 

The device is also  equippped with 2 set of EDX detectors for elemental analysis and EBSD for crystal phase analysis.