Fourier Transform Infrared Spectrometer (FTIR)

The VERTEX 80V is based on the actively aligned UltraScanTM interferometer, which provides PEAK spectral resolution. The precise linear air bearing scanner and PEAK quality optic guarantees the ultimate sensitivity and stability. VERTEX is the ideal instrument for demanding experiments such as high-resolution, ultra-fast rapid-scan, step-scan, or UV spectral range measurements. The unique Bruker DigiTectTM data acquisition technology prevents external signal disturbance and guarantees PEAK signal-to-noise ratio. With its rugged, stable cast aluminum optics bench and the evacuated optics, the VERTEX 80v eliminates atmospheric moisture absorptions and provides PEAK sensitivity and stability, especially in the far IR and terahertz spectral regions. The new automatic beamsplitter exchange unit (BMS-c) allows software-controlled extension of the spectral range without break of the spectrometer vacuum.

Applications

Research & Development

• Continuous and Step Scan technology for amplitude/phase modulation spectroscopy
• Rapid, interleaved and Step Scan technology for experiments with high temporal resolution (Step Scan / Rapid Scan / Interleaved TRS)
• Characterization of periodically ordered microscopic materials, known as metamaterials
• High resolution spectroscopy for gas analysis with resolutions better than 0.06 cm-1
• Instrumentation for vacuum FT-IR beamline installations
• Stopped-flow methods for enzyme catalysis experiments.
• External adaptation of ultrahigh vacuum measurement chambers
• FT-IR spectroelectrochemistry for the in-situ investigation of electrode surfaces and electrolytes

Pharma

• Determination of the absolute configuration of molecules (VCD)
• Characterization of stability and volatile content of medical drug products by thermal analysis (TG-FT-IR)
• Differentiation of polymorphs of active pharmaceutical ingredients in the far infrared region

Polymers and Chemistry

• Identification of inorganic fillers in polymer composites in the far infrared region
• Dynamic and rheo-optical studies of polymers
• Determination of volatile compounds and characterization of decomposition processes by thermal analysis (TGA-FT-IR)
• Reaction monitoring and reaction control (MIR fiber probe)
• Identification of inorganic minerals and pigments

 Surface Analysis

• Detection and characterization of thin and monolayers
• Surface analysis combined with polarization modulation (PM-IRRAS)

Material Science

• Characterization of optical and highly reflective materials (windows, mirrors)
• Investigation of dark materials and depth profiling by Photo-Acoustic Spectroscopy (PAS)
• Characterization of the emittance behavior of materials

Semiconductors

• Determination of oxygen and carbon contents in silicon wafers
• Low temperature transmittance and photoluminescence (PL) measurements of shallow impurities for quality control