Scanning Electron Microscopy Micrograph Images of the two materials

Two Scanning Electron Microscopy Micrograph Images compare the OIST-made material with the commercial N95 electrocharged layer, showing that there is no discernable structure difference between the two samples.
Date:
20 April 2020
Copyright OIST (Okinawa Institute of Science and Technology Graduate University, 沖縄科学技術大学院大学). Creative Commons Attribution 4.0 International License (CC BY 4.0).
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