Schematic Representation of OIST Experiment with Electrons
![](/sites/default/files/styles/embed_portrait_lg_1x/public/photos/20180326-konstantinov-electrons-experiment.jpg?itok=BwLkgF7u)
Schematic representation of the experiment. A rotating microwave field (E) is sent through a circular layer of electrons while their electrical current (I) is measured by applying voltage (V).
Schematic representation of the experiment. A rotating microwave field (E) is sent through a circular layer of electrons while their electrical current (I) is measured by applying voltage (V).
Date:
26 March 2018
Copyright OIST (Okinawa Institute of Science and Technology Graduate University, 沖縄科学技術大学院大学). Creative Commons Attribution 4.0 International License (CC BY 4.0).
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Research