Sasaki Changes the Sample

Sasaki Changes the Sample
Toshio Sasaki removes the sample from the FIB/SEM machine and replaces it with a cartridge used to recalibrate the microscope. The cartridge contains different materials, which will each refract an electron in a particular direction and at a particular speed. The FIB/SEM measures these electrons and adjusts its detection system accordingly.

Toshio Sasaki removes the sample from the FIB/SEM machine and replaces it with a cartridge used to recalibrate the microscope. The cartridge contains different materials, which will each refract an electron in a particular direction and at a particular speed. The FIB/SEM measures these electrons and adjusts its detection system accordingly.

Date:
07 August 2014

Copyright OIST (Okinawa Institute of Science and Technology Graduate University, 沖縄科学技術大学院大学). Creative Commons Attribution 4.0 International License (CC BY 4.0).

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