Single Crystal X-ray Diffractometer

Single Crystal X-ray Diffractometer: Measure crystalline single crystals non-destructively, revealing precise details like unit cell dimensions, bond lengths, bond angles, and site-ordering arrangements.

Bruker D8 Venture

A Single-Crystal X-ray Diffractometer is a highly specialised scientific instrument designed for precise elucidation of the atomic structure of crystalline materials. It provides detailed insights into the three-dimensional arrangement of atoms within a single crystal, offering comprehensive information on its crystallographic and electronic properties.

 

Operating on the fundamental principle of X-ray diffraction, the instrument bombards a single crystal with X-rays, capturing and analysing the resulting diffraction pattern. This process enables the determination of the crystal's unit cell parameters, atom positions, and symmetry elements, providing a detailed representation of its atomic structure.

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Features

Specifications

1. X-ray generator and X-ray source: Air-cooled IµS microfocus X-ray source (Cu and Mo source with 100-micron focal size) and generator (Max. 80 W for Cu source and Max. 70 W for Mo source)

2. Goniometer: Vertical mount ω-2θ type high accuracy goniometer (Kappa goniometer)

3. Goniometer head: X, Y, Z Cartesian coordinate translation, AGH (Automatic Goniometer Head)

4. Stage: ISX stage (Automated in situ crystal screening)

5. Primary optics: Multilayered confocal Mirror (HELIOS)

6. Detector: PHOTON III (C14) Charge-Integrating Pixel Array Detector (CPAD)

7. Cooling system: Cobra Plus (Oxford Cryosystems) with a temperature range (80 K – 500 K)