nnp N95-electrocharged filtration principle based face mask design using common materials Figure 9
![nnp N95-electrocharged filtration principle based face mask design using common materials Figure 9](/sites/default/files/styles/embed_lg_1x/public/2024-03/nnp_SEM20mu.png?itok=We2OjKlk)
Figure 9: Scanning Electron Microscopy (SEM) Micrograph images for OIST-made and commercial N-95 electrocharged layer sample at 20 micron resolution shows no discernible structural differences between the two samples. We are not specifying which of (a & b) are OIST-internal versus commercial N95 sample SEMs.
Date:
05 March 2024
Copyright OIST (Okinawa Institute of Science and Technology Graduate University, 沖縄科学技術大学院大学). Creative Commons Attribution 4.0 International License (CC BY 4.0).